Impact of 1064nm continuous laser irradiation on the image quality of CCD image sensors

Abstract:

Charge-coupled device (CCD) is widely used in various fields due to its high sensitivity, low power consumption, and high quantum efficiency. However, strong laser irradiation can cause permanent damage to CCD image sensors, thereby affecting the quality of the images. In order to thoroughly investigate the impact of lasers on the image quality of CCD image sensors, this paper employs objective image quality assessment methods to study the damage effects of 1064 nm continuous lasers on CCD image sensors at different power densities. Through a comprehensive analysis of grayscale distribution histograms, PSNR (peak signal-to-noise ratio), and SSIM (structural similarity index measure), the variations in image quality with increasing power density are revealed. The research results indicate that at low power density levels, the image quality decreases slowly; however, once the power density reaches a threshold, the image quality rapidly declines. When the image quality is severely damaged, the frequency of the main grayscale value drops to 0, and the degree of image damage saturates. Additionally, with the increase in power density, the dynamic range of the image first expands and then shrinks, eventually shifting towards the low grayscale value range.

Key words:laser-induced damage, charge-coupled device, gray value, PSNR