XIAO Ming
School of Electrical Engineering, Yancheng Institute of Technology, Yancheng 224007, ChinaGONG Yefei
School of Electrical and Automation Engineering, Changshu Institute of Technology, Changshu 215500, ChinaWANG Hongding
School of Physics and Electronic Engineering, Northeast Petroleum University, Daqing 163318, ChinaLU Mingli
School of Electrical and Automation Engineering, Changshu Institute of Technology, Changshu 215500, ChinaGAO Hua
Wuxi Novo Automation Technology Corporation, Wuxi 214000, China1. School of Electrical Engineering, Yancheng Institute of Technology, Yancheng 224007, China;2. School of Electrical and Automation Engineering, Changshu Institute of Technology, Changshu 215500, China;3. School of Physics and Electronic Engineering, Northeast Petroleum University, Daqing 163318, China;4. Wuxi Novo Automation Technology Corporation, Wuxi 214000, China
XIAO Ming, GONG Yefei, WANG Hongding, LU Mingli, GAO Hua. Defect detection of light guide plate based on improved YOLOv5 networks[J]. Optoelectronics Letters,2024,20(9):560-567
Copy