ZHANG Xiaodong
Hebei Semiconductor Research Institute, Shijiazhuang 050051, ChinaZHAO Lin
Hebei Semiconductor Research Institute, Shijiazhuang 050051, ChinaHAN Zhiguo
Hebei Semiconductor Research Institute, Shijiazhuang 050051, ChinaXU Xiaoqing
Hebei Semiconductor Research Institute, Shijiazhuang 050051, ChinaLI Suoyin
Hebei Semiconductor Research Institute, Shijiazhuang 050051, ChinaWU Aihua
Hebei Semiconductor Research Institute, Shijiazhuang 050051, ChinaHebei Semiconductor Research Institute, Shijiazhuang 050051, China
ZHANG Xiaodong, ZHAO Lin, HAN Zhiguo, XU Xiaoqing, LI Suoyin, WU Aihua. A reconstruction method of AFM tip by using 2 μm lattice sample[J]. Optoelectronics Letters,2022,18(7):440-443
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