Estimating the quality of stripe in structured light 3D measurement
Author:
Affiliation:

School of Information Engineering, Zhengzhou University, Zhengzhou 450001, China[* This work has been supported by the National Natural Science Foundation of China (Nos.61705198 and 61874099), the Certificate of Postdoctoral Research Grant in Henan Province (No.001801008), the Henan Innovation Demonstration Project (No.201111212300), and the Zhengzhou Major Science and Technology Innovation Project (No.2019CXZX0037).

Clc Number:

Fund Project:

  • Article
  • |
  • Figures
  • |
  • Metrics
  • |
  • Reference
  • |
  • Related
  • |
  • Cited by
  • |
  • Materials
  • |
  • Comments
    Abstract:

    lity of stripe image. In the method, two parameters, skewness coefficient of stripe gray distribution and the noise level, are used to estimate the quality of stripe. The simulation results show that the bigger the skewness coefficient is, the bigger the error of stripe locating results is. Meanwhile, the smaller the noise level is, the smaller the error of stripe locating results is. The method has been used to estimate the experimental image, and the same conclusion can be obtained. The method can be used for recognizing large error data automatically by the two parameters.

    Reference
    Related
    Cited by
Get Citation

XUE Qi, JI Wenzhao, MENG Hao, SUN Xiaohong, YE Huiying, YANG Xiaonan. Estimating the quality of stripe in structured light 3D measurement[J]. Optoelectronics Letters,2022,18(2):103-108

Copy
Share
Article Metrics
  • Abstract:
  • PDF:
  • HTML:
  • Cited by:
History
  • Received:March 04,2021
  • Revised:August 23,2021
  • Adopted:
  • Online: February 23,2022
  • Published: