School of Information Engineering, Zhengzhou University, Zhengzhou 450001, China[* This work has been supported by the National Natural Science Foundation of China (Nos.61705198 and 61874099), the Certificate of Postdoctoral Research Grant in Henan Province (No.001801008), the Henan Innovation Demonstration Project (No.201111212300), and the Zhengzhou Major Science and Technology Innovation Project (No.2019CXZX0037).
XUE Qi, JI Wenzhao, MENG Hao, SUN Xiaohong, YE Huiying, YANG Xiaonan. Estimating the quality of stripe in structured light 3D measurement[J]. Optoelectronics Letters,2022,18(2):103-108
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