ZHANG Xiao-dong
1. College of Physics and Electronic Engineering, Taishan University, Tai’an 271000, China;2. School of Physics and Electronics, Shandong Normal University, Jinan 250014, China;3. School of Physics, Beijing Institute of Technology, Beijing 100081, ChinaLI Suo-yin
1. College of Physics and Electronic Engineering, Taishan University, Tai’an 271000, China;2. School of Physics and Electronics, Shandong Normal University, Jinan 250014, China;3. School of Physics, Beijing Institute of Technology, Beijing 100081, ChinaHAN Zhi-guo
1. College of Physics and Electronic Engineering, Taishan University, Tai’an 271000, China;2. School of Physics and Electronics, Shandong Normal University, Jinan 250014, China;3. School of Physics, Beijing Institute of Technology, Beijing 100081, ChinaZHAO Lin
1. College of Physics and Electronic Engineering, Taishan University, Tai’an 271000, China;2. School of Physics and Electronics, Shandong Normal University, Jinan 250014, China;3. School of Physics, Beijing Institute of Technology, Beijing 100081, ChinaLIANG Fa-guo
1. College of Physics and Electronic Engineering, Taishan University, Tai’an 271000, China;2. School of Physics and Electronics, Shandong Normal University, Jinan 250014, China;3. School of Physics, Beijing Institute of Technology, Beijing 100081, ChinaWU Ai-hua
1. College of Physics and Electronic Engineering, Taishan University, Tai’an 271000, China;2. School of Physics and Electronics, Shandong Normal University, Jinan 250014, China;3. School of Physics, Beijing Institute of Technology, Beijing 100081, China1. College of Physics and Electronic Engineering, Taishan University, Tai’an 271000, China;2. School of Physics and Electronics, Shandong Normal University, Jinan 250014, China;3. School of Physics, Beijing Institute of Technology, Beijing 100081, China
ZHANG Xiao-dong, LI Suo-yin, HAN Zhi-guo, ZHAO Lin, LIANG Fa-guo, WU Ai-hua. A lattice measuring method based on integral imaging technology[J]. Optoelectronics Letters,2021,17(5):317-320
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