XING Zhong-qiu
National Joint Research Center for Electronic Materials and Systems, Zhengzhou University, Zhengzhou 450001, China;International Joint Laboratory of Electronic Materials and Systems, Zhengzhou University, Zhengzhou 450001, China;School of Information Engineering, Zhengzhou University, Zhengzhou 450001, ChinaZHOU Yong-jie
School of Physics and Electronic Engineering, Xinyang Normal University, Xinyang 464000, ChinaCHEN Xue
National Joint Research Center for Electronic Materials and Systems, Zhengzhou University, Zhengzhou 450001, China;International Joint Laboratory of Electronic Materials and Systems, Zhengzhou University, Zhengzhou 450001, China;School of Information Engineering, Zhengzhou University, Zhengzhou 450001, ChinaMussaab,I. Niass
National Joint Research Center for Electronic Materials and Systems, Zhengzhou University, Zhengzhou 450001, China;International Joint Laboratory of Electronic Materials and Systems, Zhengzhou University, Zhengzhou 450001, China;School of Information Engineering, Zhengzhou University, Zhengzhou 450001, ChinaWANG Yi-fu
National Joint Research Center for Electronic Materials and Systems, Zhengzhou University, Zhengzhou 450001, China;International Joint Laboratory of Electronic Materials and Systems, Zhengzhou University, Zhengzhou 450001, China;School of Information Engineering, Zhengzhou University, Zhengzhou 450001, ChinaWANG Fang
National Joint Research Center for Electronic Materials and Systems, Zhengzhou University, Zhengzhou 450001, China;International Joint Laboratory of Electronic Materials and Systems, Zhengzhou University, Zhengzhou 450001, China;School of Information Engineering, Zhengzhou University, Zhengzhou 450001, ChinaLIU Yu-huai
National Joint Research Center for Electronic Materials and Systems, Zhengzhou University, Zhengzhou 450001, China;International Joint Laboratory of Electronic Materials and Systems, Zhengzhou University, Zhengzhou 450001, China;School of Information Engineering, Zhengzhou University, Zhengzhou 450001, China1. National Joint Research Center for Electronic Materials and Systems, Zhengzhou University, Zhengzhou 450001, China;2. International Joint Laboratory of Electronic Materials and Systems, Zhengzhou University, Zhengzhou 450001, China;3. School of Information Engineering, Zhengzhou University, Zhengzhou 450001, China
XING Zhong-qiu, ZHOU Yong-jie, CHEN Xue, Mussaab, I. Niass, WANG Yi-fu, WANG Fang, LIU Yu-huai. Increased radiative recombination of AlGaN-based deep ultraviolet laser diodes with convex quantum wells[J]. Optoelectronics Letters,2020,16(2):87-91
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