Multi-matrix opto-electronic system for measuring deformation of the millimeter range radiotelescope elements
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1. Chongqing Engineering Research Center of Intelligent Sensing Technology and Microsystem, Chongqing University of Post and Telecommunications, Chongqing 400065, China

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    Abstract:

    A novel optical instrument is proposed and studied to measure the deformation of each connection point for a mirror, which includes 24 multi-matrix base units and can be used in millimeter-scale signal reflection systems. Experimental investigations reveal that the error of measurement is σ=8.7×10-3 mm at a distance of 5 500 mm, which allows to measure the linear deformation of a radiotelescope with the mirror diameter of 70 m.

    Reference
    [1] Новиков М. А. and Коняхин И. А., Современные оптико-электронные системы мониторинга деформаций объектов. // Пятая Санкт-Петербургская Ассамблея молодых учёных и специалистов. / Тезисы докладов. СПб:СПбГУ, С. 55. (2000).
    [2] Артеменко Ю. Н., Коняхин И. А., Панков Э. Д. and Тимофеев А. Н., Изв. Вузов. Приборостроение 9, 51 (2008).
    [3] Wu B and Yang S, Laser Technol. 39, 5 (2015).
    [4] Onori D., Scotti F., Scaffardi M., Bogoni A. and Laghezza F., Journal of Lightwave Technology 34, 20 (2016).
    [5] Wu H., Zhang F., Meng F., Balling P., Li J., Pan L. and Qu X., IEEE Photon. Technol. Lett. 27, 24 (2015).
    [6] Wu H., Zhao T., Wang Z., Zhang K., Xue B., Li J. and Qu X., Applied Physics Letters 111, 25 (2017).
    [7] Wang G., Li S., An G., Wang X., Zhao Y. and Zhang W., Applied Optics 54, 8817 (2015).
    [8] Дрейпер Н. and Смит Г, Прикладной регрессионный анализ. пер. с англ. М.:Финансы и статистика, Изд. 2-е, перераб. и доп 1, 366 (1986).
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LI Ren-pu, Konyakhin, Igor, Tong, Minh Hoa, ZHOU Min. Multi-matrix opto-electronic system for measuring deformation of the millimeter range radiotelescope elements[J]. Optoelectronics Letters,2019,15(2):144-146

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History
  • Received:December 07,2018
  • Online: April 03,2019
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