REN Mei-zhen
State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, Bei-jing 100083, China ;College of Materials Science and Opto-Electronic Technology, University of Chinese Academy of Sciences, Beijing 100083, ChinaZHANGJia-shun
State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, Bei-jing 100083, ChinaAN Jun-ming
State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, Bei-jing 100083, China ;College of Materials Science and Opto-Electronic Technology, University of Chinese Academy of Sciences, Beijing 100083, ChinaWANG Yue
State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, Bei-jing 100083, ChinaWANG Liang-liang
State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, Bei-jing 100083, ChinaLI Jian-guang
State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, Bei-jing 100083, ChinaWU Yuan-da
State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, Bei-jing 100083, China ;College of Materials Science and Opto-Electronic Technology, University of Chinese Academy of Sciences, Beijing 100083, ChinaYIN Xiao-jie
State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, Bei-jing 100083, ChinaHU Xiong-wei
State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, Bei-jing 100083, China1. State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, Bei-jing 100083, China ;2. College of Materials Science and Opto-Electronic Technology, University of Chinese Academy of Sciences, Beijing 100083, China
REN Mei-zhen, ZHANGJia-shun, AN Jun-ming, WANG Yue, WANG Liang-liang, LI Jian-guang, WU Yuan-da, YIN Xiao-jie, HU Xiong-wei. Investigation of Mach-Zehnder interferometer properties based on PLC technology[J]. Optoelectronics Letters,2018,14(3):170-174
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