Home > Archive>Volume 13, Issue 1, 2017 >5-9. DOI:10.1007/s11801-017-6248-x
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Investigation on refractive index sensing of single silver nanoparticle at tightly focused light illumination
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Key Laboratory of Optical Information Science and Technology, Ministry of Education, Institute of Modern Optics, Nankai University, Tianjin 300071, China

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    Abstract:

    Based on the generalized Mie theory, refractive index sensing characteristics of single silver nanoparticle respectively illuminated by tightly focused linearly-polarized and radially-polarized light beams are investigated. The spectra for localized surface plasmon resonances (LSPR) under different dielectric environments demonstrate that distinct dipolar and quadrupolar resonances can be always observed for the case of radial polarization, while there is only strong dipolar resonance for the case of linear polarization. The dipolar mode has a higher sensitivity. However, the figure of merit (FOM) for the quadrupolar resonance is much higher than that for the dipolar resonance, because the quadrupolar resonance has a narrower width.

    Reference
    [1] T. R. Jensen, M. D. Malinsky, C. L. Haynes and R. P. Van Duyne, Journal of Physical Chemistry B 104, 10549 (2000).
    [2] YANG Ai-ling, LI Shun-pin, WANG Yu-jin, BAO Xi-chang and YANG Ren-qiang, Optoelectronics Letters 10, 164 (2014).
    [3] PAN Huan, HUANG Kai-jian, BAI Zhong-chen and QIN Shui-jie, Journal of Optoelectronics.Laser 26, 1019 (2015). (in Chinese)
    [4] LI Zhao, YU Xian-tong, QIN Cui-fang, CAO Xiao-dan, PAN Hai-feng and XU Jian-hua, Journal of Optoelectronics.Laser 26, 1423 (2015). (in Chinese)
    [5] K. A. Willets and R. P. Van Duyne, Annual Review of Physical Chemistry 58, 267 (2007).
    [6] J. N. Anker, W. Paige Hall, O. Lyandres, N. C. Shah, J. Zhao and R. P. Van Duyne, Nature Materials 7, 442 (2008).
    [7] JIA Shuo, BIAN Chao, TONG Jian-hua, SUN Ji-zhou and XIA Shan-hong, Optoelectronics Letters 12, 157 (2016).
    [8] X. H. Xu, W. J. Brownlow, S. V. Kyriacou, Q. Wan and J. J. Viola, Biochemistry 43, 10400 (2004).
    [9] L. J. Sherry, S. H. Chang, G. C. Schatz and R. P. Van Duyne, Nano Letters 5, 2034 (2005).
    [10] D. McFarland and R. P. Van Duyne, Nano Letters 3, 1057 (2003).
    [11] N. M. Mojarad, V. Sandoghdar and M. Agio, Journal of the Optical Society of America B 25, 651 (2008).
    [12] N. M. Mojarad and M. Agio, Optics Express 17, 117 (2009).
    [13] G. Mie, Annals of Physics 25, 377 (1908).
    [14] J. Lermé, C. Bonnet, M. Broyer, E. Cottancin, S. Marhaba and M. Pellarin, Physical Review B 77, 245406 (2008).
    [15] C. J. R. Sheppard and P. T?r?k, Journal of Modern Optics 44, 803 (1997).
    [16] C. F. Bohren and D. R. Huffman, Absorption and Scattering of Light by Small Particles, Wiley, New York, 95 (1983).
    [17] P. B. Johnson and R. W. Christy, Physical Review B 6, 4370 (1972).
    [18] S. Zou and G. C. Schatz, Journal of Chemical Physics 121, 12606 (2004).
    [19] J. Butet, I. Russier-Antoine, C. Jonin, N. Lascoux, E. Benichou and P. F. Brevet, Nano Letters 12, 1697 (2012).
    [20] L. J. Sherry, R. Jin, C. A. Mirkin, G. C. Schatz and R. P. Van Duyne, Nano Letters 6, 2060 (2006).
    [21] X. L. Wang, J. Ding, W. J. Ni, C. S. Guo and H. T. Wang, Optics Letters 32, 3549 (2007).
    [22] X. P. Li, T. H. Lan, C. H. Tien and M. Gu, Nature Communications 3, 998 (2012).
    [23] A. F. Abouraddy and K. C. Toussaint, Physical Review Letters 96, 153901 (2006).
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SHEN Si, WANG Xiang-hui, SUN Jing-wei, FAN Fei, CHANG Sheng-jiang. Investigation on refractive index sensing of single silver nanoparticle at tightly focused light illumination[J]. Optoelectronics Letters,2017,13(1):5-9

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  • Received:November 06,2016
  • Online: January 11,2017
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