A correction method of color projection fringes in 3D contour measurement
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1. Key Laboratory of Advanced Electrical Engineering and Energy Technology, Tianjin Polytechnic University, Tianjin 300387, China;;2. Department of Electricity Examination, Patent Examination Cooperation Tianjin Center of the Patent Office, State Intellectual Property Office, Tianjin 300304, China;;3. School of Electrical, Computer and Telecommunications Engineering, University of Wollongong, Keiraville 2500, Australia

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This work has been supported by the National Natural Science Foundation of China (Nos.60808020 and 61078041), the National Science and Technology Support (No.2014BAH03F01), the Tianjin Research Program of Application Foundation and Advanced Technology (No.10JCYBJC07200), and the Technology Program of Tianjin Municipal Education Commission (No.20130324).

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    Abstract:

    In the three-dimensional (3D) contour measurement, the phase shift profilometry (PSP) method is the most widely used one. However, the measurement speed of PSP is very low because of the multiple projections. In order to improve the measurement speed, color grating stripes are used for measurement in this paper. During the measurement, only one color sinusoidal fringe is projected on the measured object. Therefore, the measurement speed is greatly improved. Since there is coupling or interference phenomenon between the adjacent color grating stripes, a color correction method is used to improve the measurement results. A method for correcting nonlinear error of measurement system is proposed in this paper, and the sinusoidal property of acquired image after correction is better than that before correction. Experimental results show that with these correction methods, the measurement errors can be reduced. Therefore, it can support a good foundation for the high-precision 3D reconstruction.

    Reference
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SONG Li-mei, LI Zong-yan, CHEN Chang-man, XI Jiang-tao, GUO Qing-hua, LI Xiao-jie. A correction method of color projection fringes in 3D contour measurement[J]. Optoelectronics Letters,2015,11(4):303-306

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History
  • Received:March 25,2015
  • Online: November 26,2015
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