XUE Yu-ming
Tianjin Key Laboratory of Film Electronic and Communication Devices, Department of Electronics Information Engineering, Tianjin University of Technology, Tianjin 300384, ChinaGAO Lin
Tianjin Key Laboratory of Film Electronic and Communication Devices, Department of Electronics Information Engineering, Tianjin University of Technology, Tianjin 300384, ChinaYIN Fu-hong
Tianjin Key Laboratory of Film Electronic and Communication Devices, Department of Electronics Information Engineering, Tianjin University of Technology, Tianjin 300384, ChinaQIAO Zai-xiang
National Key Laboratory of Power Sources, Tianjin Institute of Power Sources, Tianjin 300381, ChinaLIU Hao
Tianjin Key Laboratory of Film Electronic and Communication Devices, Department of Electronics Information Engineering, Tianjin University of Technology, Tianjin 300384, ChinaFENG Shao-jun
Tianjin Key Laboratory of Film Electronic and Communication Devices, Department of Electronics Information Engineering, Tianjin University of Technology, Tianjin 300384, ChinaSUN Hai-tao
Tianjin Key Laboratory of Film Electronic and Communication Devices, Department of Electronics Information Engineering, Tianjin University of Technology, Tianjin 300384, ChinaHANG Wei
Tianjin Key Laboratory of Film Electronic and Communication Devices, Department of Electronics Information Engineering, Tianjin University of Technology, Tianjin 300384, China1. Tianjin Key Laboratory of Film Electronic and Communication Devices, Department of Electronics Information Engineering, Tianjin University of Technology, Tianjin 300384, China;;2. National Key Laboratory of Power Sources, Tianjin Institute of Power Sources, Tianjin 300381, China
This work has been supported by the National High Technology Research and Development Program of China (No.2012AA050701).
XUE Yu-ming, GAO Lin, YIN Fu-hong, QIAO Zai-xiang, LIU Hao, FENG Shao-jun, SUN Hai-tao, HANG Wei. Research on structural characteristics of large-scale CdS thin films deposited by CBD under low ammonia condition[J]. Optoelectronics Letters,2015,11(4):273-276
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