Li-mei Song
Key Laboratory of Advanced Electrical Engineering and Energy Technology, Tianjin Polytechnic University, Tianjin, 300387, ChinaZong-yan Li
Key Laboratory of Advanced Electrical Engineering and Energy Technology, Tianjin Polytechnic University, Tianjin, 300387, ChinaYu-lan Chang
Key Laboratory of Advanced Electrical Engineering and Energy Technology, Tianjin Polytechnic University, Tianjin, 300387, ChinaGuang-xin Xing
Key Laboratory of Advanced Electrical Engineering and Energy Technology, Tianjin Polytechnic University, Tianjin, 300387, ChinaPeng-qiang Wang
Key Laboratory of Advanced Electrical Engineering and Energy Technology, Tianjin Polytechnic University, Tianjin, 300387, ChinaJiang-tao Xi
School of Electrical, Computer and Telecommunications Engineering, University of Wollongong, Keiraville, 2500, AustraliaTeng-da Zhu
Key Laboratory of Advanced Electrical Engineering and Energy Technology, Tianjin Polytechnic University, Tianjin, 300387, ChinaThis work has been supported by the National Natural Science Foundation of China (Nos.60808020 and 61078041), and the Tianjin Research Program of Application Foundation and Advanced Technology (No. 10JCYBJC07200).
Li-mei Song, Zong-yan Li, Yu-lan Chang, Guang-xin Xing, Peng-qiang Wang, Jiang-tao Xi, Teng-da Zhu. A color phase shift profilometry for the fabric defect detection[J]. Optoelectronics Letters,2014,10(4):308-312
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