Design and analysis for a high-accuracy CCD
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TN386.5

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    Abstract:

    In order to improve the test accuracy of CCD,a new type of CCD device is proposed.Several columns(rows) of photoelectric diodes(PDs) are combined together,and staggered with the distance of H1=H/N,where H is the space between two adjacent PDs,and N is the number of columns(rows).The photoelectric signals are collected simultaneously by multi-channel A/D,and the accurate measurement result is obtained through appropriate signal processing.Without changing the size or space of PDs,more photographi...

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WANG He-shun, ZHU Wei-bing, WANG Qiang, CHEN Ci-chang. Design and analysis for a high-accuracy CCD[J]. Optoelectronics Letters,2011,7(3):167-170

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