Fluorescent emission characteristics of polycrystalline diamond film prepared by direct current jet CVD
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Abstract:
The free-standing diamond films are deposited on molybdenum substrate by direct current jet chemical vapor deposition (DCJCVD). X-ray diffraction,Raman spectroscopy and cathodoluminescence (CL) measurement are used to investigate the films structure and defects related to electron transition properties of the diamond films. The X-ray diffraction spectrum reveals that the diamond films have the polycrystalline cubic structure with diffraction peaks at 43.88o and 75.24o. A sharp peak at 1331.8 cm-1 and a broa...
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Clc Number:
TN304
