Fluorescent emission characteristics of polycrystalline diamond film prepared by direct current jet CVD
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TN304

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    Abstract:

    The free-standing diamond films are deposited on molybdenum substrate by direct current jet chemical vapor deposition (DCJCVD). X-ray diffraction,Raman spectroscopy and cathodoluminescence (CL) measurement are used to investigate the films structure and defects related to electron transition properties of the diamond films. The X-ray diffraction spectrum reveals that the diamond films have the polycrystalline cubic structure with diffraction peaks at 43.88o and 75.24o. A sharp peak at 1331.8 cm-1 and a broa...

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Lan-fang Wang, Xi-ming Chen, Zhong-peng Zhang, Jin-yan Zhuang, Lan Li. Fluorescent emission characteristics of polycrystalline diamond film prepared by direct current jet CVD[J]. Optoelectronics Letters,2009,5(5):356-358

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  • Received:October 23,2006
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