Shape measurement by carrier modulation in electronic speckle pattern interferometry
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Abstract:
A shape measurement based on ESPI by using carder is presented.When the tested object is tilted with a small angle,the carrier pattern containing altitude information is formed on the object surface.By using the carrier pattern captured by a CCD camera,the phase of the object can be derived by Fourier transform and the shape measurement is realized.The principle of the method is introduced and proved by an experiment.
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Clc Number:
TN247
