Traceable long range scanning tunneling microscopy
CSTR:
  • Article
  • | |
  • Metrics
  • | |
  • Related [20]
  • | | |
  • Comments
    Abstract:

    Dimensionally correct and directly traceable measurement is not feasible with conventional scanning tunneling microscopy (STMs) due to severe hysteresis and non-linearity of the commonly applied piezo tube scanners and the very short range.By integrating a custom made probing system based on tunneling current measurement into a commercially available and laser-interferometrically position controlled positioning system, an STM with a principal measuring range of 25 mm×25 mm×5 mm and traceable position measurement has been set-up and tested.

    Key words:TH742
    Reference
    Cited by
    Comments
    Comments
    分享到微博
    Submit
Get Citation

A. Weckenmann, J. Hoffmann. Traceable long range scanning tunneling microscopy[J]. Optoelectronics Letters,2008,4(1):49-50

Copy
Share
Article Metrics
  • Abstract:3785
  • PDF: 194
  • HTML: 0
  • Cited by: 0
History
  • Received:August 21,2007
Article QR Code